Design for Test (DFT) Engineer

About the Role

What you'll do:

• Help build out and advance the DFT flow—insertion, pattern generation, verification, and signoff—integrated into the broader RTL-to-GDSII methodology
• Architect and implement test access for our multi-die package—post-package scan-chain access, known-good-die (KGD) sorting and screening, die-to-die (D2D) interconnect test, and a package-level test-access architecture designed in from the start rather than retrofitted
• Implement DFT structures across the full range: scan (stuck-at, transition/at-speed), compression, boundary scan (JTAG/IEEE 1149.x), and IEEE 1500 core wrapping
• Implement and verify Memory BIST, with particular emphasis on external MBIST controllers and shared/centralized BIST architectures serving distributed memory instances
• Drive ATPG, fault simulation, coverage closure, and pattern conversion/porting to the ATE environment (STIL/WGL)
• Perform DFT verification: scan chain integrity, pattern verification, and gate-level simulation (with SDF/timing) across all test modes
• Help define and review DFT specifications, test access architecture, and test budgets (pin count, test time, coverage targets)
• Support silicon bring-up, debug, diagnosis, and yield/failure analysis, correlating ATE results back to design
• Collaborate with physical design on scan stitching, test point insertion, timing, and power-aware test (DFT interaction with power domains/UPF)
• Document methodology and continuously automate and improve the flow

What we're looking for

• BS/MS in Electrical Engineering, Computer Engineering, or related field.
• 7+ years of hands-on DFT engineering on complex digital SoC/ASIC designs
• Breadth across all of DFT — architecture, insertion, ATPG, BIST, boundary scan, verification, and silicon test — not just one sub-domain
• DFT flow development — building, automating, and maintaining flows, not just running them
• Hierarchical / core-wrapping DFT — hands-on architecting and implementing test at the core/block level
• Multi-die / advanced-package DFT — post-package scan access, known-good-die (KGD) sorting, die-to-die interconnect test, and test-access architecture
• Deep Siemens Tessent expertise — Scan & ATPG (TestKompress), MemoryBIST (incl. external/shared MBIST), BoundaryScan/IJTAG (SSN a plus)
• Strong command of the fundamentals — scan insertion, ATPG (stuck-at/transition/path-delay), fault models, compression, JTAG/1149.x, IEEE 1500, scan-chain architecture, and coverage analysis
• Gate-level simulation of test modes / DFT pattern verification; scripting for flow automation (Tcl, Python, Perl)
• Familiarity with ATE pattern formats (STIL/WGL) and the design-to-tester handoff; solid RTL (Verilog/SystemVerilog) and SDC
• Low-power DFT (UPF/CPF, power-aware ATPG, retention/isolation test) (preferred)

Compensation

Final offers depend on level, location, and skills relevant to the role. Additional compensation: equity grant per company guidelines; medical / dental / vision; 401(k); standard PTO.

Visa Sponsorship

DensityAI sponsors qualified candidates for H-1B, O-1, TN, E-3, and other employment-based visas, and we welcome applicants on F-1 OPT and STEM-OPT. Work authorization is required at start; we provide immigration support to secure or transfer status.

Export Controls

Aspects of this role may involve access to information subject to U.S. export controls (EAR/ITAR). We may discuss licensing or scope adjustments during the interview.

Equal Opportunity

DensityAI is an Equal Opportunity Employer. We do not discriminate on the basis of race, color, religious creed, national origin, ancestry, physical or mental disability, medical condition, genetic information, marital status, sex, gender, gender identity, gender expression, age (40+), sexual orientation, military or veteran status, pregnancy, or any other status protected by law. We comply with the California CROWN Act and provide reasonable accommodations on request.